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Line Card

Brand：Frontier Semiconductor

Place of Origin：U.S.A

Model：Line Card

Keyword tag：Film Stress；FEOL Electrical Characterization；Thin wafer metrology；Line Card
021-37018108Online Message

Line Card

    

3DIC TSV and BWS TTV
Film Stress
FEOL Electrical Characterization
Thin wafer metrology
Film AdhesionGlobal Film Stress Adhesion
Local and Lattice Stress
Thickness, Topography & Geometry
Contact and Non-Contact Sheet Resistance

Metrology Tools forSemiconductor, LED, Solar, FPD, MEMS, Data Storage

 

 

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